The Essentials of Testing Digital Circuit
Електронного архіву Харківського національного університету радіоелектроніки (Open Access Repository of KHNURE)
Переглянути архів Інформація| Поле | Співвідношення | |
| Creator |
Ngene, Ch. U.
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| Date |
2014-12-09T12:01:52Z
2014-12-09T12:01:52Z 2012 |
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| Identifier |
Ngene, C. U. The Essentials of Testing Digital Circuits / C. U. Ngene // Радиоэлектроника и информатика : науч.-техн. журн. – Х. : Изд-во ХНУРЭ, 2012. – Вып. 1. – С. 22-30.
http://hdl.handle.net/123456789/1697 |
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| Description |
Testing is an important part of digital devices development life cycle and it takes about 70% of time to market. This paper discusses the various testing concepts as it relates to digital design and how it impacts the reliability of the final product. We also show that making designs testable by using appropriate design for testability techniques considerably reduces testing time and ensures a fine-grained diagnosis of finished product. A three bit counter circuit was used to illustrate the benefits of design for testability by using scan chain methodology. |
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| Language |
en
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| Publisher |
ХНУРЭ
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| Subject |
reliability
design for testability faults defect level |
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| Title |
The Essentials of Testing Digital Circuit
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| Type |
Article
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