Structure perfection of bulk and near-surface layers in sapphire single crystals
Vernadsky National Library of Ukraine
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Structure perfection of bulk and near-surface layers in sapphire single crystals
|
|
| Creator |
Tkachenko, V.F.
Puzikov, V.M. Dan`ko, A.Ya. Budnikov, A.T. Lukienko, O.A. |
|
| Subject |
Technology
|
|
| Description |
Triple-crystal X-ray diffractometry has been used to study the structure perfection in bulk and surface layer of basal-oriented sapphire single crystals grown using horizontal directional crystallization (HDC) in reducing atmosphere by the Czochralski technique and machined and annealed in various manners.
|
|
| Date |
2018-06-16T17:55:02Z
2018-06-16T17:55:02Z 2007 |
|
| Type |
Article
|
|
| Identifier |
Structure perfection of bulk and near-surface layers in sapphire single crystals / V.F. Tkachenko, V.M. Puzikov, A.Ya. Dan`ko, A.T. Budnikov, O.A. Lukienko // Functional Materials. — 2007. — Т. 14, № 4. — С. 550-554. — Бібліогр.: 7 назв. — англ.
1027-5495 http://dspace.nbuv.gov.ua/handle/123456789/136939 |
|
| Language |
en
|
|
| Relation |
Functional Materials
|
|
| Publisher |
НТК «Інститут монокристалів» НАН України
|
|